Zeiss Xradia 520 Versa

Home » Facilities » University of Warwick » Zeiss Xradia 520 Versa

Overview

This system is aimed at higher resolution scanning, with an achievable pixel size down to 0.2 microns with the use of 0.4x, 4x, 10x, 20x, and 40x objectives. This makes it particularly suitable for the investigation of materials and characterisation of microstructures. Further, its stability at lower kV has shown excellent results for biological specimens.

The system is suitable for samples up to 50 mm in diameter, but we largely advise that if a sample is greater than 20 mm in diameter, you should use either the Nikon XT H 225/320 LC or Tescan Unitom XL systems. The system is set up for use with Deben rigs, with the cabling already safely in place for the 500 N and 10 kN systems. Where a high resolution is required, but over a larger field of view, the system has vertical and horizontal stitch modes.

Enquire