Nikon XT H 225/320 LC - National X-ray Computed Tomography

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Nikon XT H 225/320 LC

Home » Facilities » University of Warwick » Nikon XT H 225/320 LC

Overview

This system can fulfil most generic CT scanning requirements where high time/spatial resolution or penetration is not an issue. It can accommodate sample diameters of 240 mm, up to a height of 750 mm. The system has a cable labyrinth that can be utilised for in-situ testing or monitoring.

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