Zeiss Xradia 520 Versa

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Our two Zeiss Versa 520 systems are best suited for smaller samples of less than 5mm diameter that allow us to fully utilise their sub-micron resolution capability. Source energies can go up to 10 W at 160 kV. The Versa systems can be used for in-situ work with our Deben CT5000 or Hysitron Nanoindentation stages. One of our two systems is equipped with a Diffraction Contrast Tomography (DCT) module to allow detection of grain orientations and grain boundaries in polycrystalline materials.


Key Features
  • Resolution capability of 0.2 to 28 µm using lenses that combine both geometric and optical magnification
  • 40 to 160 kV energy range with a power capability of 10 W
  • Housed within an enlarged cabinet designed specifically for the application of in-situ rigs
  • In-line phase contrast capability for imaging low X-ray absorbing specimens
  • Scout and zoom software designed specifically for region of interest scanning
  • Exposure correction for high aspect ration specimens
  • Wide field mode for scanning wide specimens by stitching radiographs together to increase the field of view
  • Automated filter changer for rapid beam optimisation
  • Labyrinth for the external control and monitoring of user-installed equipment
  • Duel GPU reconstruction capability allows for minimal reconstruction time
An image of Zeiss Xradia Versa 520

Zeiss Xradia Versa 520. Credit: UoM