Our two Zeiss Versa 520 systems are best suited for smaller samples of less than 5mm diameter that allow us to fully utilise their sub-micron resolution capability. Source energies can go up to 10 W at 160 kV. The Versa systems can be used for in-situ work with our Deben CT5000 or Hysitron Nanoindentation stages. One of our two systems is equipped with a Diffraction Contrast Tomography (DCT) module to allow detection of grain orientations and grain boundaries in polycrystalline materials.
- General capabilities as for the ZEISS Xradia 520 system
- Utilisation of Diffraction Computed Tomography (DCT)
- Housed within an enlarged cabinet designed specifically for the application of in-situ rigs
- Dedicated cable encapsulation of in-situ rig control