Nikon XT H 225

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Our three Nikon Metrology systems are best suited for larger samples, from a few mm diameter to approximately 20 cm diameter. With their high-power 225 kV and 320 kV x-ray sources, they can achieve transmission of sample up to approximately 30 mm steel. Our two walk-in bay systems are additionally well suited for in-situ work, using one of our in-situ rigs.

The Nikon Metrology XTH 225 kV cabinet system – for samples of a few cm diameter and less than 30 cm in length.


Key Features
  • Typical scan times using the Nikon Metrology 225/320 kV Custom bay vary from 10 to 120 minutes.
  • The resolution will vary from 3 to 104 µm for specimen areas with a diameter of < 10 mm and up to 300 mm diameters respectively.
  • Specimens larger than 300 mm can be analysed by taking linked scans that can then be pieced back together during the reconstruction stage, however this capability is limited by the cabinet size
  • Image of the Nikon XTEK XTH 225kV
    Nikon XTEK XTH 225kV. Credit: UoM.