Zeiss Metrotom 1500 - National X-ray Computed Tomography

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Zeiss Metrotom 1500

Home » Facilities » University of Warwick » Zeiss Metrotom 1500

Overview

225kV
3k x 3k detector
7um minimum resolution
Metrology rated system (manufacturer quoted): 4.5 + L/50 um
330mm max sample diameter in FOV
870mm max sample height

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