Zeiss Xradia 510 Versa

Home » Facilities » University of Southampton » Zeiss Xradia 510 Versa


This scanner uses a two-stage magnification approach to achieve sub-micron spatial resolution at source to object distance much greater than these allowed in conventional X-ray CT systems. Zeiss’s resolution at a distance (RaaDTM) approach combines the geometric magnification of the X-ray imaging with a smart system of microscope lenses to further magnify the image. The system is fitted with x0.4, x4, x20, and x40 magnification lens mounted on a barrel mount for rapid change over. This means that the operator can achieve submicron resolution (pixel size ≥ 70 nm or spatial resolution ≥ 0.7 µm) at large working distances, allowing for imaging of larger specimens or small specimens in contained in-situ rigs. Importantly, the machine is capable of phase-contrast imaging overcoming an important limitations of conventional absorption-based CT imaging; i.e. low or complete absence of contrast for low Z materials. The latter is particular useful for biomedical imaging, CFRP and polymer imaging applications.


Key Features
  • 30 -160 kVp
  • 2048 x 2048 pixel detector
  • Multiple magnification objectives up to 40x
  • Spatial resolution: 0.7 µm
  • Phase-enhanced contrast imaging modes
  • Image of a Zeiss 160 KvP Versa 510 microscope at the University of Southampton
    Versa interior. Credit: Sharif Ahmed/UoS