Zeiss Xradia 520 Versa with DCT

Overview

Our two Zeiss Versa 520 systems are best suited for smaller samples of less than 5mm diameter that allow us to fully utilise their sub-micron resolution capability. Source energies can go up to 10 W at 160 kV. The Versa systems can be used for in-situ work with our Deben CT5000 or Hysitron Nanoindentation stages. One of our two systems is equipped with a Diffraction Contrast Tomography (DCT) module to allow detection of grain orientations and grain boundaries in polycrystalline materials.

Key Features

• General capabilities as for the ZEISS Xradia 520 system
• Utilisation of Diffraction Computed Tomography (DCT)
• Housed within an enlarged cabinet designed specifically for the application of in-situ rigs
• Dedicated cable encapsulation of in-situ rig control