Zeiss Xradia 520 Versa
Overview
Our two Zeiss Versa 520 systems are best suited for smaller samples of less than 5mm diameter that allow us to fully utilise their sub-micron resolution capability. Source energies can go up to 10 W at 160 kV. The Versa systems can be used for in-situ work with our Deben CT5000 or Hysitron Nanoindentation stages. One of our two systems is equipped with a Diffraction Contrast Tomography (DCT) module to allow detection of grain orientations and grain boundaries in polycrystalline materials.
Key Features
- Resolution capability of 0.2 to 28 µm using lenses that combine both geometric and optical magnification
- 40 to 160 kV energy range with a power capability of 10 W
- Housed within an enlarged cabinet designed specifically for the application of in-situ rigs
- In-line phase contrast capability for imaging low X-ray absorbing specimens
- Scout and zoom software designed specifically for region of interest scanning
- Exposure correction for high aspect ration specimens
- Wide field mode for scanning wide specimens by stitching radiographs together to increase the field of view
- Automated filter changer for rapid beam optimisation
- Labyrinth for the external control and monitoring of user-installed equipment
- Duel GPU reconstruction capability allows for minimal reconstruction time
