Zeiss Xradia 810 Ultra

Overview

The Zeiss Xradia 810 Ultra can achieve the highest spatial resolution achievable in a lab-based X-ray microscope (<100 nm in 3D) and the unique possibility of employing absorption and Zernike phase contrast imaging to characterise the widest range of samples. With a quasi-monochromatic and quasi-parallel beam this X-ray microscope can be compared to a lab-based synchrotron in terms of spatial resolution achievable. A nano-mechanical load stage can be installed within the instrument to perform in-situ compression-indentation-tensile experiments on a different array of samples.

Key Features

  • Cr 5.4 keV (quasi-monochromatic, quasi-parallel)
  • 65 µm x 65 µm in large field of view mode
  • 16 µm x 16 µm in high resolution mode
  • Spatial resolution: 150 nm and 50 nm in large field of view and high resolution, respectively
  • Multi-contrast: absorption and phase contrast (Zernike)
  • Maximum sample stage load capacity: 1 kg
  • Scan time: minutes to hours, depending on scanning mode, resolution and sample features
National X-Ray Computed Tomography
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