Key Features

• Resolution capability from 0.17 mm for specimen areas with a diameter of less than 0.2 mm and up to 240 mm
• Helical scanning and reconstruction capability for removal of cone beam artefacts, better signal to noise ratio and faster scanning of long specimens requiring multiple scans
• 20-160 kV (8W) X-ray source
• Sample manipulator stage with a 7 kg load capacity and stage displacement of X: 100 mm, Y: 400 mm and a 360 degree continuous rotation capability
• An amorphous silicon 16 bit 3072 x 3072 pixel detector

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